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DC characterization of an InP/InGaAs tunneling emitter bipolar transistor (TEBT)

Author(s):
Chen, C.-Y. ( National Cheng-Kung Univ. (Taiwan) )
Cheng, S.-Y. ( Oriental Institute of Technology (Taiwan) )
Chuang, H.-M. ( National Cheng-Kung Univ. (Taiwan) )
Chen, J.-Y. ( National Cheng-Kung Univ. (Taiwan) )
Fu, S.-I. ( National Cheng-Kung Univ. (Taiwan) )
Tsai, C.-H. ( National Cheng-Kung Univ. (Taiwan) )
Chang, C.-Y. ( National Cheng-Kung Univ. (Taiwan) )
Hung, C.-W. ( National Cheng-Kung Univ. (Taiwan) )
Chen, C.-W. ( National Cheng-Kung Univ. (Taiwan) )
Liu, W.-C. ( National Cheng-Kung Univ. (Taiwan) )
5 more
Publication title:
Microelectronics: Design, Technology, and Packaging
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5274
Pub. date:
2004
Page(from):
425
Page(to):
432
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451675 [0819451673]
Language:
English
Call no.:
P63600/5274
Type:
Conference Proceedings

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