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Femtosecond pulse damage behavior of oxide dielectric thin films

Author(s):
Mero, M. ( Univ. of New Mexico (USA) )
Liu, J. ( Fudan Univ. (China) )
Zeller, J. ( Univ. of New Mexico (USA) )
Rudolph, W.G. ( Univ. of New Mexico (USA) )
Starke, K. ( Laser Zentrum Hannover e.V. (Germany) )
Ristau, D. ( Laser Zentrum Hannover e.V. (Germany) )
1 more
Publication title:
Laser-Induced Damage in Optical Materials: 2003
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5273
Pub. Year:
2004
Page(from):
8
Page(to):
16
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451637 [0819451630]
Language:
English
Call no.:
P63600/5273
Type:
Conference Proceedings

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