Blank Cover Image

Monitoring of chemical degradation in propellants using AOTF spectrometer

Author(s):
Publication title:
Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5268
Pub. Year:
2004
Page(from):
96
Page(to):
103
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451576 [0819451576]
Language:
English
Call no.:
P63600/5268
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings AOTF-based system for image cytometry

Rajwa, B., Ahmed, W., Venkatapathi, M., Gregori, G., Jin, F., Soos, J., Trivedi, S., Robinson, J. P.

SPIE - The International Society of Optical Engineering

Baldwin,D.P., Zamzow,D.S., Eckels,D.E., Miller,G.P.

SPIE - The International Society for Optical Engineering

Trivedi S, Rosemeier J, Jin F, Kutcher S, Chen R, Prasad N

SPIE - The International Society of Optical Engineering

Abruna, H. D., Pariente, F., Alonso, J. L., Lorenzo, E., Trible, K., Cha, S. K.

American Chemical Society

Rodriguez P., Lorenzo J., Jin F., Trivedi S., Wang C.-C., Dhar N. K., Fairchild S.

SPIE - The International Society of Optical Engineering

Cullum, B.M., Mobley, J., Wintenberg, A.L., Maples, R.A., Stokes, D.L., Vo-Dinh, T.

SPIE-The International Society for Optical Engineering

E. J. Grove, R. Lofaro, P. Soo, M. Villaran, F. Hsu

American Society of Mechanical Engineers

Cullum, B.M., Mobley, J., Wintenberg, A.L, Maples, R.A., Stokes, D.L., Vo-Dinh, T.

SPIE-The International Society for Optical Engineering

Korablev, O.I., Bertaux, J.-L., Dimarellis, E., Grigoriev, A., Kalinnikov, Yu., Stepanov, A., Guibert, S.

SPIE-The International Society for Optical Engineering

Kim,D., You,J.W., Kim,S.H., Kong,H.J., Lee,Y.W., Chegal,W., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Sinha, P. G., Xiong, X., Jin, F., Trivedi, S., Prasad, N. S.

SPIE - The International Society of Optical Engineering

Henning, P.F., Chadha, S., Damren, R., Rowe, R.C., Stevenson, C., Curtiss, L.E., DiGiuseppe, T.G.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12