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Thickness and composition monitoring of thin layers of InGaAs in InP/InGaAsP epitaxial growths using FESEM and integrated SIMS profiles

Author(s):
Publication title:
Applications of photonic technology 6 : closing the gap between theory, development, and application : Photonics North 2003
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5260
Pub. Year:
2003
Page(from):
463
Page(to):
469
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451484 [0819451487]
Language:
English
Call no.:
P63600/5260
Type:
Conference Proceedings

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