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Nondestructive in-line monitoring method for diffusion process control in InP

Author(s):
Qian, Y.Y. ( Bookham Technology (Canada) )
Pawlowicz, C. ( Bookham Technology (Canada) )
Temchenko, V. ( Bookham Technology (Canada) )
Elliott, C. ( Bookham Technology (Canada) )
Woodard, A. ( Bookham Technology (Canada) )
Bryskiewicz, T. ( Bookham Technology (Canada) )
Kirkwood, K. ( Bookham Technology (Canada) )
Hewitt, K. ( Bookham Technology (Canada) )
3 more
Publication title:
Applications of photonic technology 6 : closing the gap between theory, development, and application : Photonics North 2003
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5260
Pub. Year:
2003
Page(from):
432
Page(to):
435
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451484 [0819451487]
Language:
English
Call no.:
P63600/5260
Type:
Conference Proceedings

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