n/t measurements of sol-gel ZrO2 thin films

n/t measurements of sol-gel ZrO2 thin films

Author(s):

Elalamy, Z. ( Institut Fresnel, CNRS-ENSPM (France) )

Drouard, E. ( Institut Fresnel, CNRS-ENSPM (France) )

Escoubas, L. ( Institut Fresnel, CNRS-ENSPM (France) )

Flory, F. ( Institut Fresnel, CNRS-ENSPM (France) )

McGovern, T. ( Institut Fresnel, CNRS-ENSPM (France) )

Simon, J.-J. ( Institut Fresnel, CNRS-ENSPM (France) )

1 more

Publication title:

Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5250

Pub. Year:

2004

Page(from):

278

Page(to):

285

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451347 [0819451347]

Language:

English

Call no.:

P63600/5250

Type:

Conference Proceedings

Details

TDL ID:	ZA00013595
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Systems Design : Advances in optical thin films
Conf. info. (Number):	2003
Conf. info. (Venue):	St. Etienne, France
Conf. info. (Date):	2003.09.30-2003.10.03

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