Blank Cover Image

Computer-aided prostrate cancer diagnosis using image enhancement and JPEG2000

Author(s):
Publication title:
Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5203
Pub. Year:
2003
Page(from):
323
Page(to):
334
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450760 [0819450766]
Language:
English
Call no.:
P63600/5203
Type:
Conference Proceedings

Similar Items:

Nakashima, H., Yamamoto, T., Kubo, M., Kawata, Y., Niki, N., Ohmatsu, H., Eguchi, K., Nishiyama, H., Kaneko, M., …

SPIE - The International Society of Optical Engineering

Okumura,T., Miwa,T., Kako,J., Yamamoto,S., Matsumoto,M., Tateno,Y., Iinuma,T., Matsumoto,T.

SPIE-The International Society for Optical Engineering

Mohamed, S. S., Salama, M. M. A.

SPIE - The International Society of Optical Engineering

Sato, H., Niki, N., Mori, K., Eguchi, K., Kaneko, M., Moriyama, N., Ohmatsu, H., Kakinuma, R., Masuda, H., Machida, S., …

SPIE-The International Society for Optical Engineering

X. Huang, M. Ding, T. Xu, S. Zhang

Society of Photo-optical Instrumentation Engineers

Lalgudi, H. G., Bilgin, A., Marcellin, M. W., Tabesh, A., Nadar, M. S., Trouard, T. P.

SPIE - The International Society of Optical Engineering

L.R. Myers, Jr., C.M. Kocur, S.K. Rogers, C. Eisenbies, J.W. Hoffmeister

Society of Photo-optical Instrumentation Engineers

Haberman,K., Pathak,S.D., Grimm,P.D., Kim,Y.

SPIE - The International Society for Optical Engineering

Toshioka,S., Kanazawa,K., Niki,N., Satoh,H., Ohmatsu,H., Eguchi,K., Moriyama,N.

SPIE-The International Society for Optical Engineering

Yova,D.M., Atlamazoglou,V., Davaris,P., Kavantzas,N., Loukas,S.

SPIE-The International Society for Optical Engineering

Serryo, C., Serra, A., Fonseca, P., Dias, J.M.S.

SPIE - The International Society of Optical Engineering

Seong W, Cho J S, Noh S M, Park J W

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12