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Optical characterization in wide spectral range by a coherent spectrophotometer

Author(s):
Sirutkaitis, V. ( Vilnius Univ. (Lithuania) )
Eckardt, R.C. ( Cleveland Crystals, Inc. (USA) )
Balachninaite, O. ( Vilnius Univ. (Lithuania) )
Grigonis, R. ( Vilnius Univ. (Lithuania) )
Melninkaitis, A. ( Vilnius Univ. (Lithuania) )
Rakickas, T. ( Vilnius Univ. (Lithuania) )
1 more
Publication title:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5188
Pub. Year:
2003
Page(from):
19
Page(to):
34
Pages:
16
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450616 [0819450618]
Language:
English
Call no.:
P63600/5188
Type:
Conference Proceedings

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