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Regression analysis for wavefront fitting with Zernike polynomials

Author(s):
  • Qi, B. ( Institute of Optics and Electronics (China) )
  • Chen, H. ( Institute of Optics and Electronics (China) )
  • Ma, J. ( Institute of Optics and Electronics (China) )
  • Dong, N. ( Institute of Optics and Electronics (China) )
Publication title:
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5180
Pub. Year:
2003
Page(from):
429
Page(to):
436
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450531 [0819450537]
Language:
English
Call no.:
P63600/5180
Type:
Conference Proceedings

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