Blank Cover Image

Self-calibration for microrefractive lens measurements

Author(s):
  • Gardner, N. ( Univ. of North Carolina/Charlotte (USA) )
  • Randolph, T. ( Univ. of North Carolina/Charlotte (USA) )
  • Davies, A. ( Univ. of North Carolina/Charlotte (USA) )
Publication title:
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5180
Pub. Year:
2003
Page(from):
244
Page(to):
252
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450531 [0819450537]
Language:
English
Call no.:
P63600/5180
Type:
Conference Proceedings

Similar Items:

Gardner, N., Davies, A., Bergner, B.

SPIE - The International Society of Optical Engineering

Gardner, N. W., Davies, A. D.

SPIE - The International Society of Optical Engineering

Schmitz, T. L., Gardner, N., Vaughn, M., Davies, A.

SPIE - The International Society of Optical Engineering

Hagiwara,T., Mizutani,H., Kondo,N., Inoue,J., Kaneko,K., Higashibata,S.

SPIE-The International Society for Optical Engineering

Bergner, B.C., Davies, A.

SPIE - The International Society of Optical Engineering

Gugsa, S. A., Davies, A.

SPIE - The International Society of Optical Engineering

Gardner, N., Davies, A.

SPIE - The International Society of Optical Engineering

Davies, A., Schmitz, T. L.

SPIE-The International Society for Optical Engineering

Karodkar, D., Gardner, N., Bergner, B.C., Davies, A.

SPIE - The International Society of Optical Engineering

Takac,M.T., Ye,J., Raugh,M.R., Pease,R.F.W., Berglund,C.N., Owen,G.

SPIE-The International Society for Optical Engineering

Mundhenk,T.N., Rivett,M.J., Liao,X., Hall,E.L.

SPIE-The International Society for Optical Engineering

Gardner, Leo R.

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12