Advances in reflection grating technology for Constellation-X

Advances in reflection grating technology for Constellation-X

Author(s):

Heilmann, R.K. ( Massachusetts Institute of Technology (USA) )

Akilian, M. ( Massachusetts Institute of Technology (USA) )

Chang, C.-H. ( Massachusetts Institute of Technology (USA) )

Chen, C.G. ( Massachusetts Institute of Technology (USA) )

Forest, C.R. ( Massachusetts Institute of Technology (USA) )

Joo, C. ( Massachusetts Institute of Technology (USA) )

Konkola, P.T. ( Massachusetts Institute of Technology (USA) )

Montoya, J.C. ( Massachusetts Institute of Technology (USA) )

Sun, Y. ( Massachusetts Institute of Technology (USA) )

You, J. ( Massachusetts Institute of Technology (USA) )

Schattenburg, M.L. ( Massachusetts Institute of Technology (USA) )

6 more

Publication title:

Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5168

Pub. Year:

2004

Page(from):

271

Page(to):

282

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450418 [0819450413]

Language:

English

Call no.:

P63600/5168

Type:

Conference Proceedings

Details

TDL ID:	ZA00013547
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.04-2003.08.07

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