Advances in reflection grating technology for Constellation-X
- Author(s):
Heilmann, R.K. ( Massachusetts Institute of Technology (USA) ) Akilian, M. ( Massachusetts Institute of Technology (USA) ) Chang, C.-H. ( Massachusetts Institute of Technology (USA) ) Chen, C.G. ( Massachusetts Institute of Technology (USA) ) Forest, C.R. ( Massachusetts Institute of Technology (USA) ) Joo, C. ( Massachusetts Institute of Technology (USA) ) Konkola, P.T. ( Massachusetts Institute of Technology (USA) ) Montoya, J.C. ( Massachusetts Institute of Technology (USA) ) Sun, Y. ( Massachusetts Institute of Technology (USA) ) You, J. ( Massachusetts Institute of Technology (USA) ) Schattenburg, M.L. ( Massachusetts Institute of Technology (USA) ) - Publication title:
- Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5168
- Pub. Year:
- 2004
- Page(from):
- 271
- Page(to):
- 282
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450418 [0819450413]
- Language:
- English
- Call no.:
- P63600/5168
- Type:
- Conference Proceedings
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