Optical metrology for the segmented optics on the Constellation-X soft x-ray telescope

Optical metrology for the segmented optics on the Constellation-X soft x-ray telescope

Author(s):

Content, D.A. ( NASA Goddard Space Flight Ctr. (USA) )

Colella, D. ( ManTech International Corp. (USA) and NASA Goddard Space Flight Ctr. (USA) )

Fleetwood, C. ( Swales Aerospace (USA) )

Hadjimichael, T. ( Swales Aerospace (USA) )

Saha, T.T. ( NASA Goddard Space Flight Ctr. (USA) )

Wright, G. ( NASA Goddard Space Flight Ctr. (USA) )

Zhang, W.W. ( NASA Goddard Space Flight Ctr. (USA) )

2 more

Publication title:

Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5168

Pub. Year:

2004

Page(from):

207

Page(to):

218

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450418 [0819450413]

Language:

English

Call no.:

P63600/5168

Type:

Conference Proceedings

Details

TDL ID:	ZA00013547
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.04-2003.08.07

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