Optical metrology for the segmented optics on the Constellation-X soft x-ray telescope
- Author(s):
Content, D.A. ( NASA Goddard Space Flight Ctr. (USA) ) Colella, D. ( ManTech International Corp. (USA) and NASA Goddard Space Flight Ctr. (USA) ) Fleetwood, C. ( Swales Aerospace (USA) ) Hadjimichael, T. ( Swales Aerospace (USA) ) Saha, T.T. ( NASA Goddard Space Flight Ctr. (USA) ) Wright, G. ( NASA Goddard Space Flight Ctr. (USA) ) Zhang, W.W. ( NASA Goddard Space Flight Ctr. (USA) ) - Publication title:
- Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5168
- Pub. Year:
- 2004
- Page(from):
- 207
- Page(to):
- 218
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450418 [0819450413]
- Language:
- English
- Call no.:
- P63600/5168
- Type:
- Conference Proceedings
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