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Positional accuracy as a measure of Chandra's optical distortions

Author(s):
Beckerman, E. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Aldcroft, T. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Gaetz, T.J. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Jerius, D.H. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Nguyen, D. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Tibbetts, M. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
1 more
Publication title:
X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5165
Pub. Year:
2004
Page(from):
445
Page(to):
456
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450388 [0819450383]
Language:
English
Call no.:
P63600/5165
Type:
Conference Proceedings

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