Swift/BAT calibration and the estimated BAT hard x-ray survey sensitivity

Swift/BAT calibration and the estimated BAT hard x-ray survey sensitivity

Author(s):

Parsons, A.M. ( NASA Goddard Space Flight Ctr. (USA) )

Tueller, J. ( NASA Goddard Space Flight Ctr. (USA) )

Krimm, H. ( NASA Goddard Space Flight Ctr. (USA) and Universities Space Research Association (USA) )

Barthelmy, S.D. ( NASA Goddard Space Flight Ctr. (USA) )

Cummings, J. ( NASA Goddard Space Flight Ctr. (USA) and Universities Space Research Association (USA) )

Markwardt, C. ( NASA Goddard Space Flight Ctr. (USA) and Univ. of Maryland/College Park (USA) )

Hullinger, D. ( NASA Goddard Space Flight Ctr. (USA) and Univ. of Maryland/College Park (USA) )

Gehrels, N. ( NASA Goddard Space Flight Ctr. (USA) )

Fenimore, E. ( Los Alamos National Lab. (USA) )

Palmer, D. ( Los Alamos National Lab. (USA) )

Sato, G. ( Institute of Space and Astronautical Science (Japan) )

Nakazawa, K. ( Institute of Space and Astronautical Science (Japan) )

Takahashi, T. ( Institute of Space and Astronautical Science (Japan) )

Watanabe, S. ( Institute of Space and Astronautical Science (Japan) )

Okada, Y. ( Univ. of Tokyo (Japan) )

Takahashi, H. ( Univ. of Tokyo (Japan) )

Suzuki, M. ( Saitama Univ. (Japan) )

Tashiro, M. ( Saitama Univ. (Japan) )

13 more

Publication title:

X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5165

Pub. Year:

2004

Page(from):

190

Page(to):

200

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450388 [0819450383]

Language:

English

Call no.:

P63600/5165

Type:

Conference Proceedings

Details

TDL ID:	ZA00013544
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : X-Ray, and Gamma-Ray Instrumentation for Astronomy
Conf. info. (Number):	2003 : 13th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.03-2003.08.05

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