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Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor

Author(s):
Neal, D.R. ( WaveFront Sciences, Inc. (USA) )
Pulaski, P. ( WaveFront Sciences, Inc. (USA) )
Raymond, T.D. ( WaveFront Sciences, Inc. (USA) )
Neal, D.A. ( WaveFront Sciences, Inc. (USA) )
Wang, Q. ( National Institute of Standards and Technology (USA) )
Griesmann, U. ( National Institute of Standards and Technology (USA) )
1 more
Publication title:
Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5162
Pub. date:
2003
Page(from):
129
Page(to):
138
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450357 [0819450359]
Language:
English
Call no.:
P63600/5162
Type:
Conference Proceedings

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