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Confocal microscopy for the testing of integrated optical devices

Author(s):
Quercioli, F. ( Istituto Nazionale di Ottica Applicata (Italy) )
Tiribilli, B. ( Istituto Nazionale di Ottica Applicata (Italy) )
Vassalli, M. ( Istituto Nazionale di Ottica Applicata (Italy) )
Ghirelli, A. ( Istituto Nazionale di Ottica Applicata (Italy) )
Righini, G.C. ( Istituto di Fisica Applicata Nello Carrara (Italy) )
Pelli, S. ( Istituto di Fisica Applicata Nello Carrara (Italy) )
Cremona, M. ( Pontificia Univ. Catolica do Rio de Janeiro (Brazil) )
2 more
Publication title:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4829
Pub. Year:
2003
Page(from):
665
Page(to):
667
Pages:
3
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819445964 [0819445967]
Language:
English
Call no.:
P63600/4829.2
Type:
Conference Proceedings

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