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Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces

Author(s):
Malou, F. ( CNES, Toulouse, France )
Bezerra, F. ( CNES, Toulouse, France )
Salvaterra, G. ( Astrium, Velizy Villacoublay, France )
Chatry, C. ( TRAD, Labege, France )
Falo, W. ( TRAD, Labege, France )
David, J-P. ( ONERA, Toulouse, France )
Duzellier, S. ( ONERA, Toulouse, France )
2 more
Publication title:
Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
Title of ser.:
ESA SP
Ser. no.:
507
Pub. Year:
2002
Page(from):
387
Page(to):
392
Pages:
6
Pub. info.:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290928171 [9290928174]
Language:
English
Call no.:
E11690/507
Type:
Conference Proceedings

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