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Hardening analog and power management integrated circuits against single-event effects

Author(s):
Van Vonno, N.W. ( Intersil Corporation, Melbourne, FL, USA )  
Publication title:
Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
Title of ser.:
ESA SP
Ser. no.:
507
Pub. date:
2002
Page(from):
265
Page(to):
274
Pages:
10
Pub. info.:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290928171 [9290928174]
Language:
English
Call no.:
E11690/507
Type:
Conference Proceedings

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