An overview of radiation single event effects testing of advanced memory components

An overview of radiation single event effects testing of advanced memory components

Author(s):: Harboe-Sorensen, R. ( ESA/ESTEC, Noordwijk, the Netherlands )
Publication title:: Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
Title of ser.:: ESA SP
Ser. no.:: 507
Pub. Year:: 2002
Page(from):: 239
Page(to):: 246
Pages:: 8
Pub. info.:: Noordwijk, The Netherlands: ESA Publications Division
ISSN:: 03796566
ISBN:: 9789290928171 [9290928174]
Language:: English
Call no.:: E11690/507
Type:: Conference Proceedings

Details

TDL ID:	ZA00013503
Series ID:	PA00000009
Conf. info. (Name):	European Space Components Conference : ESCCON 2002
Conf. info. (Number):	2002
Conf. info. (Venue):	Toulouse, France
Conf. info. (Date):	2002.09.24-2002.09.27

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