Evaluation of the Sensitivity of Newly Emerging ED-SOI Technologies to the Combined Low Temperature and Radiation Environment in Space

Evaluation of the Sensitivity of Newly Emerging ED-SOI Technologies to the Combined Low Temperature and Radiation Environment in Space

Author(s):

Patel, J. ( NASA/JPL, USA )
Yuan, J. ( NASA/JPL, USA )
Vandooren, A. ( NASA/JPL, USA )
Kayali, S. ( NASA/JPL, USA )

Publication title:

Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands

Title of ser.:

ESA SP

Ser. no.:

439

Pub. Year:

2000

Page(from):

375

Page(to):

382

Pages:

8

Pub. info.:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

03796566

ISBN:

9789290927563 [9290927569]

Language:

English

Call no.:

E11690/439

Type:

Conference Proceedings

Details

TDL ID:	ZA00013447
Series ID:	PA00000009
Conf. info. (Name):	European Space Components Conference : ESCCON 2000
Conf. info. (Number):	2000
Conf. info. (Venue):	Noordwijk, The Netherlands
Conf. info. (Date):	2000.03.21-2000.03.23

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