Development of 1M Gate CMOS Gate Array

Development of 1M Gate CMOS Gate Array

Author(s):

Nemoto, N. ( NASDA Japan )

Shindou, H. ( NASDA Japan )

Makihara, A. ( NASDA Japan )

Kuboyama, S. ( NASDA Japan )

Matsuda, S. ( NASDA Japan )

Sugimoto, K. ( HighReliability Components Corp, Japan )

Qikawa, K. ( HighReliability Components Corp, Japan )

Nashiyama, I. ( HighReliability Components Corp, Japan )

Itoh, H. ( Japan Atomic Energy Research Institute )

4 more

Publication title:

Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands

Title of ser.:

ESA SP

Ser. no.:

439

Pub. Year:

2000

Page(from):

325

Page(to):

330

Pages:

6

Pub. info.:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

03796566

ISBN:

9789290927563 [9290927569]

Language:

English

Call no.:

E11690/439

Type:

Conference Proceedings

Details

TDL ID:	ZA00013447
Series ID:	PA00000009
Conf. info. (Name):	European Space Components Conference : ESCCON 2000
Conf. info. (Number):	2000
Conf. info. (Venue):	Noordwijk, The Netherlands
Conf. info. (Date):	2000.03.21-2000.03.23

Similar Items:

1 Conference Proceedings Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs Nemoto, N., Matsuzaki, K., Aoki, J., Akiitsu, T., Matsuda, S., Naito, I., Itoh, H., Nashiyama, I. European Space Agency	7 Conference Proceedings Three-dimensional memory module for space application Yamada, N., Kuboyama, S., Matsuda, S., Sato, K., Hatada, K ESA Publications Division
2 Conference Proceedings Application of Field Programmable Gate Arrays to Space Projects Chiba, K., Kuboyama, S., Sugimoto, K., Sakaide, Y. European Space Agency	8 Conference Proceedings Influence of Post-Oxidation Annealing on Electrical Characteristics in 6H-SiC MOSFETs Ohshima, T., Yoshikawa, M., Itoh, H., Kojima, K., Okada, S., Nashiyama, I. Trans Tech Publications
3 Conference Proceedings A Stress Analysis of Large-Size Plastic Encapsulated Microelectronics with Thermal Cycle Test Makihara, A., Ooura, A., Iwaoka, M., Sugimoto, K., Akutsa, T., Matsuda, S. European Space Agency	9 Conference Proceedings Characterization of Electronic Charged States of Si-Based Quantum Dots for Floating Gate Application S. Miyazaki, M. Ikeda, K. Makihara Electrochemical Society
4 Conference Proceedings Mitaka optical and infrared array first stage(MIRA-I.1)instruments Nishikawa,J., Sato,K., Yoshizawa,M., Fukushima,T., Machida,Y., Honma,Y., Torii,Y., Matsuda,K., Kubo,K., Iwashita,H., … SPIE - The International Society for Optical Engineering	10 Conference Proceedings Characterization of Electronic Charged States of Si-Based Quantum Dots and Their Application to Floating Gate Memories S. Miyazaki, M. Ikeda, K. Makihara Electrochemical Society
5 Conference Proceedings Evaluation of Low-k Porous Silica Film Incorporated with Ethylene Groups Uchida, Y., Qikawa, M., Itoh, Y., Ishida, K. Electrochemical Society	11 Conference Proceedings Relationship between Donor Activation and Defect Annealing in 6H-SiC Hot-Implanted with Phosphorus Ions Ohshima, T., Uedono, A., Itoh, H., Yoshikawa, M., Kojima, K., Okada, S., Nashiyama, I., Abe, K., Tanigawa, S., Frank, … Trans Tech Publications
6 Conference Proceedings Generation Mechanisms of Trapped Charges in Oxide Layers of 6H-SiC MOS Structures Irradiated with Gamma-Rays Yoshikawa,M., Saitoh,K., Ohshima,T., Itoh,H., Nashiyama,I., Takahashi,Y., Ohnishi,K., Okumura,H., Yoshida,S. Trans Tech Publications	12 Conference Proceedings The instrumentation, object stars, and the first obsevations of MIRA-1.2 (Mitaka optical and infrared array) Sato, K., Nishikawa, J., Yoshizawa, M., Ohishi, N., Fukushima, T., Torii, Y., Matsuda, K., Kubo, K., Iwashita, H., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12