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Effect of Charge Distribution on Burnout Threshold of Hardened Power MOSFET

Author(s):
Salame, C. ( Universifte de Perpignan, France )
Pelanchon, F. ( Universifte de Perpignan, France )
Mialhe, P. ( Universifte de Perpignan, France )
Hoffmann, A. ( Supelec France )
Charles, J.-P. ( Supelec France )
Kerns, S. ( Franklin W. Olin College of Engineering, USA )
Kerns, D.V. ( Franklin W. Olin College of Engineering, USA )
Adams, L. ( Brunel University, United Kingdom )
3 more
Publication title:
Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
439
Pub. date:
2000
Page(from):
25
Page(to):
30
Pages:
6
Pub. info.:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290927563 [9290927569]
Language:
English
Call no.:
E11690/439
Type:
Conference Proceedings

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