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Contamination Effects During Bake-out Tests of Subsystem Level Space Hardware

Author(s):
Nuss, H.E. ( IABG mbH Germany & ESA-ESTEC )  
Publication title:
Third International Symposium on Environmental Testing for Space Programmes : ESTEC, Noordwijk, The Netherlands 24-27 June 1997
Title of ser.:
ESA SP
Ser. no.:
408
Pub. Year:
1997
Page(from):
313
Page(to):
320
Pages:
8
Pub. info.:
Noordwijk, Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290923152 [9290923156]
Language:
English
Call no.:
E11690/408
Type:
Conference Proceedings

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