Blank Cover Image

Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum

Author(s):
Budai, J.D.
Yang, W.
Larson, B.C.
Tischler, J.Z.
Liu, W.
Weiland, H.
Ice, G.E.
2 more
Publication title:
Recrystallization and grain growth : SF2M : proceedings of the second Joint International Conference on Recrystallization and Grain Growth, ReX & GG2, SF2M, held in Annecy, France, 30th August - 3rd September 2004
Title of ser.:
Materials science forum
Ser. no.:
467-470
Pub. Year:
2004
Page(from):
1373
Page(to):
1378
Pages:
6
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499526 [0878499520]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Deformation Microstructure Under Nanoindentations in Cu Using 3D X-ray Structural Microscopy

Yang, Wenge, Larson, B.C., Pharr, G.M., Ice, G.E., Swadener, J.G., Budai, J.D., Tischler, J.Z., Liu, Wenjun

Materials Research Society
7 Conference Proceedings Strain and Texture in Al-Interconnect Wires Measured by X-ray Microbeam Diffraction

Tamura, N., Chung, J-S., Ice, G. E., Larson, B. C., Budai, J. D., Tischler, J. Z., Yoon, M., Williams, E. L., Lowe, W. …

MRS - Materials Research Society
2 Conference Proceedings 2D and 3D X-Ray Structural Microscopy Using Submicron-Resolution Laue Microdiffraction

Budai, John D., Yang, Wenge, Larson, Bennett C., Tischler, Jonathan Z., Liu, Wenjun, Ice, Gene E.

Materials Research Society
8 Conference Proceedings X-Ray Microbeam Strain Measurements in Polycrystalline Films

Gray III, G.T., Moyer, L., Yang, W., Larson, B.C., Ice, G.E.

Trans Tech Publications
3 Conference Proceedings 3-D measurement of deformation microstructure in Al(0.2%)Mg using submicron resolution white X-ray microbeams

Larson, B. C., Tamura, N., Chung, J-S., Ice, G. E., Budai, J. D., Tischler, J. Z., Yang, W., Weiland, H., Lowe, W. P.

MRS-Materials Research Society
9 Conference Proceedings X-Ray Measurements of Phason Distortion in Ion-Implanted Al-Mn

Budai,J.D.

Trans Tech Publications
4 Conference Proceedings X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films

Moyer, L.E., Cargill, G.S. III, Yang, W., Larson, B.C., Ice, G.E.

Materials Research Society
10 Conference Proceedings OVERHEATING IN SILICON DURING PULSED-LASER IRRADIATION?

Larson, B.C., Tischler, J.Z., Mills, D.M.

Materials Research Society
5 Conference Proceedings Time-resolved materials science opportunities using synchrotron x-ray sources

B.C. Larson, J.Z. Tischler

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings Multilayer Laue lenses as high-resolution x-ray optics (Invited Paper)

Maser, J., Stephenson, G.B., Vogt, S., Yun, W., Macrander, A., Kang, H.C., Liu, C., Conley, R.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings X-ray Microbeam Investigation of Deformation Microstructure in Microindented Cu

Yang, Wenge, Larson, B. C., Pharr, G. M., Ice, G. E., Tischler, J. Z., Budai, J. D., Liu, Wenjun

Materials Research Society
12 Conference Proceedings X-ray Microbeam Measurement of Local Texture and Strain in Metals

Chung, J-S., Tamura, N., Ice, G. E., Larson, B. C., Budai, J. D., Lowe, W.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12