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Characterizations of SiC/SiO2 Interface Quality Toward High Power MOSFETs Realization

Author(s):
Ziane, D.
Bluet, J.M.
Guillot, G.
Godignon, P.
Monserrat, J.
Ciechonski, R.
Syvajarvi, M.
Yakimova, R.
Chen, L.
Mawby, P.
5 more
Publication title:
Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003
Title of ser.:
Materials science forum
Ser. no.:
457-460
Pub. Year:
2004
Page(from):
1281
Page(to):
1286
Pages:
6
Pub. info.:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499434 [0878499431]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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