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Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Author(s):
Twigg, M.E.
Stahlbush, R.E.
Fatemi, M.
Arthur, S.D.
Fedison, J.B.
Tucker, J.B.
Wang, S.
2 more
Publication title:
Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003
Title of ser.:
Materials science forum
Ser. no.:
457-460
Pub. Year:
2004
Page(from):
537
Page(to):
542
Pages:
6
Pub. info.:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499434 [0878499431]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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