Comparison of Pd/Ge/Ti/Pt and Pd/Si/Ti/Pt Ohmic Contacts to N-Type InGaAs for AlGaAs/GaAs HBTs
- Author(s):
- Kim, I.H.
- Publication title:
- Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003
- Title of ser.:
- Materials science forum
- Ser. no.:
- 449-452
- Pub. Year:
- 2004
- Page(from):
- 921
- Page(to):
- 924
- Pages:
- 4
- Pub. info.:
- Zuerich: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878499397 [0878499393]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
AN INITIAL INVESTIGATION OF THE ELECTRICAL AND MICROSTRUCTURAL PROPERTIES OF Au/Ti AND Au/Pd/Ti OHMIC CONTACT STRUCTURES FOR AlGaAs/GaAs HBTs
MRS - Materials Research Society |
MRS - Materials Research Society |
2
Conference Proceedings
A Microstructural and Electrical Investigation of Pd/Ge/Ti/Au Ohmic Contact to n-Type GaAs
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
Materials Research Society |
MRS - Materials Research Society |