Blank Cover Image

Global X-Ray Method for the Determination of Stress Profiles

Author(s):
Publication title:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002
Title of ser.:
Materials science forum
Ser. no.:
404-407
Pub. Year:
2002
Page(from):
19
Page(to):
24
Pages:
6
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499007 [0878499008]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Sprauel, J. M., Michaud, H.

Trans Tech Publications

7 Conference Proceedings X-ray stress analysis

Sprauel,J.M., Castex,L.

Trans Tech Publications

Lahlal, A., Sprauel, J.M., Michaud, H.

Trans Tech Publications

Sprauel, J.M.

Trans Tech Publications

Michaud, H., Sprauel, J.M., Galzy, F.

Trans Tech Publications

H. Michaud, J.M. Sprauel, C. Braham

Trans Tech Publications

B. Mireux, T. Buslaps, V. Honkimäki, A. Lodini, J.M. Sprauel

Trans Tech Publications

Galzy, F., Michaud, H., Sprauel, J. M.

Trans Tech Publications

Carrado, A., Sprauel, J.M., Barrallier, L., Lodini, A.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12