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Influence of Trenching Effect on the Characteristics of Buried-Gate SiC Junction Field-Effect Transistors

Author(s):
Koo, S.-M.
Lee, S.-K.
Zetterling, C.-M.
Ostling, M.
Forsberg, U.
Janzen, E.
1 more
Publication title:
Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001
Title of ser.:
Materials science forum
Ser. no.:
389-393
Pub. Year:
2002
Page(from):
1235
Page(to):
1238
Pages:
4
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498949 [087849894X]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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