Blank Cover Image

The Nature and Diffusion of Intrinsic Point Defects in SiC

Author(s):
Publication title:
Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001
Title of ser.:
Materials science forum
Ser. no.:
389-393
Pub. date:
2002
Page(from):
471
Page(to):
476
Pages:
6
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498949 [087849894X]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Bockstedte, M., Heid, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

7 Conference Proceedings Boron in SiC: Structure and Kinetics

Bockstedte, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

Mattausch, A., Bockstedte, M., Pankratov, O.

Trans Tech Publications

Bockstedte, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

Bockstedte, M., Heid, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

Mattausch, A., Bockstedte, M., Pankratov, O.

Trans Tech Publications

Bockstedte, M., Pankratov, O.

Trans Tech Publications

Mattausch, A., Bockstedte, M., Pankratov, O.

Trans Tech Publications

Bockstedte, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

Mattausch, A., Bockstedte, M., Pankratov, O.

Trans Tech Publications

Bockstedte, M., Mattausch, A., Pankratov, O.

Trans Tech Publications

Mattausch, A., Bockstedte, M., Pankratov, O.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12