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Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Author(s):
Persson, P.O.A.
Jacobson, H.
Molina-Aldareguia, J.M.
Bergman, J.P.
Tuomi, T.
Clegg, W.J.
Janzen, E.
Hultman, L.
3 more
Publication title:
Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001
Title of ser.:
Materials science forum
Ser. no.:
389-393
Pub. Year:
2002
Page(from):
423
Page(to):
426
Pages:
4
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498949 [087849894X]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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