Defect Study on Si Implanted with B and BF2 Ions by Coincidence Doppler Broadening Measurements
- Author(s):
- Publication title:
- Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany
- Title of ser.:
- Materials science forum
- Ser. no.:
- 363-365
- Pub. Year:
- 2001
- Page(from):
- 469
- Page(to):
- 471
- Pages:
- 3
- Pub. info.:
- Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878498758 [0878498753]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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