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Detailed Microscopic Defect Identification in GaAs

Author(s):
Publication title:
Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany
Title of ser.:
Materials science forum
Ser. no.:
363-365
Pub. date:
2001
Page(from):
76
Page(to):
78
Pages:
3
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498758 [0878498753]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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