Blank Cover Image

Analysis of Instability and Strain Concentration during Superplastic Deformation

Author(s):
Publication title:
Superplasticity in advanced materials, ICSAM-2000 : proceedings of the 2000 International Conference on Superplasticity in Advanced Materials (ICSAM-2000) held at Sheraton International Resort, Orlando [Florida], USA during August 1-4, 2000
Title of ser.:
Materials science forum
Ser. no.:
357-359
Pub. Year:
2001
Page(from):
411
Page(to):
416
Pages:
6
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498741 [0878498745]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

C.O. Kim, J.H. Kim, N.K. Chung

Trans Tech Publications

Zullo, L.C., Worstell, J.H.

American Institute of Chemical Engineers

Han, J.H., Baeck, S.M., Oh, K.H., Chung, Y. H.

Trans Tech Publications

Yoon,K.J., Chung,J.H., Goo,N.S., Park,H.C.

SPIE-The International Society for Optical Engineering

M. Wang, H.Z. Guo, Y.J. Liu

Trans Tech Publications

Y.L. Chen, A.D. Shan, J.H. Jiang, Y. Ding

Trans Tech Publications

Frost, H. J., Raj, R.

Materials Research Society

Liauo, C. S., Lou, B. Y., Cheng, C. Y., Huang, J. C., Kao, P. W., Huang, W. H.

Trans Tech Publications

Zahid, G. H., Todd, R. I., Prangnell, P. B.

Trans Tech Publications

Chung, Y.H., Ahn, J.P., Kim, H.D., Hwang, B.B., Engler, O., Huh, M.Y.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12