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Structural and Electrical Characterization of Ion Beam Synthesized and n-Doped SiC Layers

Author(s):
Serre, C.
Panknin, D.
Perez-Rodriguez, A.
Romano-Rodriguez, A.
Morante, J.R.
Koegler, R.
Skorupa, W.
Esteve, J.
Acero, M.C.
4 more
Publication title:
Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000
Title of ser.:
Materials science forum
Ser. no.:
353-356
Pub. Year:
2001
Page(from):
591
Page(to):
594
Pages:
4
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498734 [0878498737]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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