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Real-Time Dielectric Measurements and Microstructure of Polymer/Clay Nanocomposites

Author(s):
  • Bur, A.J. ( National Institute of Standards and Technology )
  • Lee, Y.H. ( National Institute of Standards and Technology )
  • Roth, S.C. ( National Institute of Standards and Technology )
Publication title:
ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.:
62
Pub. Year:
2004
Page(from):
1284
Page(to):
1289
Pages:
6
Pub. info.:
Brookfield Center, Conn.: Society of Plastics Engineers
ISBN:
9780975370704 [0975370707]
Language:
English
Call no.:
S42700/62-1
Type:
Conference Proceedings

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