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Multisensor integrated automated inspection system

Author(s):
Chen, H. ( Tsinghua Univ. (China) )
Wang, B.
Luo, X.
Liu, Z.
Ding, J.
Zhu, J.
1 more
Publication title:
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5253
Pub. Year:
2003
Page(from):
528
Page(to):
531
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819451378 [0819451371]
Language:
English
Call no.:
P63600/5253
Type:
Conference Proceedings

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