Blank Cover Image

Absolute distance measurement with the MSTAR sensor

Author(s):
Lay, O. P. ( Jet Propulsion Lab. (USA) )
Dubovitsky, S.
Peters, R. D.
Burger, J.
Ahn, S.-W. ( Univ. of Southern California (USA) )
Steier, W. H.
Fetterman, H. R. ( Pacific Wave Industries, Inc, (USA) )
Chang, Y.
3 more
Publication title:
Recent Developments in Traceable Dimensional Measurements II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5190
Pub. Year:
2003
Page(from):
361
Page(to):
372
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819450630 [0819450634]
Language:
English
Call no.:
P63600/5190
Type:
Conference Proceedings

Similar Items:

Lay, O. P., Dubovitsky, S., Peters, R. D., Burger, J., Steier, W. H., Ahn, S. -W., Fetterman, H. R.

SPIE - The International Society of Optical Engineering

Kim, S.-W., Rhee, H.-G., Joo, J.-Y., Kim, Y.-J.

SPIE - The International Society of Optical Engineering

Peters, R.D., Lay, O.P., Dubovitsky, S., Burger, J., Jeganathan, M.

SPIE - The International Society of Optical Engineering

Zhu,D.X., Dubovitsky,S., Steier,W.H., Tishinin,D., Dapkus,P.D., Uppal,K.

SPIE - The International Society for Optical Engineering

R. D. Peters, O. P. Lay

ESA Publications Division

Zhu,D.X., Dubovitsky,S., Steier,W.H., Tishinin,D., Dapkus,P.D., Uppal,K.

SPIE - The International Society for Optical Engineering

Ziari, M., Chen, A., Kalluri, S., Steier, W. H., Shi, Y., Wang, W., Chen, D., Fetterman, H. R.

American Chemical Society

Hoanca,B., Dubovitsky,S., Zhu,D.X., Sawchuk,A.A., Steier,W.H., Dapkus,P.D.

SPIE - The International Society for Optical Engineering

Dubovitsky, S., Lay, O. P.

SPIE - The International Society of Optical Engineering

O. P. Lay, S. Dubovitsky, D. A. Shaddock, B. Ware, C. S. Woodruff

Society of Photo-optical Instrumentation Engineers

Lay, O. P., Dubovitsky, S.

SPIE - The International Society of Optical Engineering

Fetterman,H.R., Chang,D.H., Erlig,H., Oh,M.C., Zhang,C.H., Steier,W.H., Dalton,L.R.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12