Detection of salient curvature features on surfaces and their applications

Detection of salient curvature features on surfaces and their applications

Author(s):

Yin, Z. ( Shanghai Jiaotong Univ. (China) )
Liu, X. ( Shanghai Jiaotong Univ. (China) )
Jiang, S. ( Shanghai Jiaotong Univ. (China) )

Publication title:

Visual Communications and Image Processing 2003

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5150

Pub. Year:

2003

Vol.:

Part Three

Page(from):

2152

Page(to):

2163

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450234 [0819450235]

Language:

English

Call no.:

P63600/5150

Type:

Conference Proceedings

Details

TDL ID:	ZA00013137
Series ID:	PA00000029
Conf. info. (Name):	Visual communications and image processing
Conf. info. (Number):	2003
Conf. info. (Venue):	Lugano, Switzerland
Conf. info. (Date):	2003.07.08-2003.07.11

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