Printability study for phase-shift masks at 193-nm lithography

Printability study for phase-shift masks at 193-nm lithography

Author(s):

Philipsen, V. ( IMEC vzw (Belgium) )
Jonckheere, R.M. ( IMEC vzw (Belgium) )

Publication title:

19th European Conference on Mask Technology for Integrated Circuits and Microcomponents

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5148

Pub. Year:

2003

Page(from):

79

Page(to):

89

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450180 [0819450189]

Language:

English

Call no.:

P63600/5148

Type:

Conference Proceedings

Details

TDL ID:	ZA00013133
Series ID:	PA00000029
Conf. info. (Name):	European Mask and Lithography Conference : European Conference on Mask Technology for Integrated Circuits and Microcomponents
Conf. info. (Number):	2003 : 19th
Conf. info. (Venue):	Sonthofen, Germany
Conf. info. (Date):	2003.01.13-2003.01.15

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