Blank Cover Image

Semiquantitative analysis of atherosclerotic plaque using optical coherence tomography and time-of-flight secondary ion mass spectrometry

Author(s):
Korol, R.M. ( Univ. of Western Ontario (Canada) )
Togonu-Bickersteth, B. ( Robarts Research Institute (Canada) )
Yang, V.X. ( Univ. of Toronto (Canada) )
Dimov, S. ( Univ. of Western Ontario (Canada) )
Vatsya, P. ( Univ. of Western Ontario (Canada) )
Gordon, M. ( Univ. of Toronto (Canada) )
Vitkin, A. ( Univ. of Toronto (Canada) )
Liu, L. ( Robarts Research Institue (Canada) )
Canham, P. ( Univ. of Western Ontario (Canada) )
Clarke, S. ( Robarts Research Institute (Canada) )
Lucas, A. ( Robarts Research Institute (Canada) )
6 more
Publication title:
Optical coherence tomography and coherence techniques : 22-24 June 2003, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5140
Pub. Year:
2003
Page(from):
212
Page(to):
220
Pages:
9
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819450104 [0819450103]
Language:
English
Call no.:
P63600/5140
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Optical detection of structural changes in human carolid atherosclerotic plaque [5862-20]

Korok, R. M., Canham, P. B., Finlay, H. M., Quantz, M., Fergusan, C. G., Liu, L. Y., Lucas, A. R.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings ANALYSIS OF SUBMICRON ALUMINUM AND ALUMINA PARTICLES BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)

Lindley, Patricia M., Schueler, Bruno W., Diebold, Main C., Hockett, Richard S., Mulholland, George

Electrochemical Society
2 Conference Proceedings Doppler optical coherence tomography for monitoring the vascular effects of photodynamic therapy

Gordon, M.L., Yang, V.X.D., Yue, E.S., Lo, S.S.W., Wilson, B.C., Vitkin, I.A.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings FEASIBILITY OF ANALYSIS OF SILICON SURFACE CLEAN TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY

Hossain-Pas, S.D., Pas, M.F., Douglas, M.A.

Electrochemical Society
3 Conference Proceedings Analysis of Organic Contamination in Gases Using Nonvolatile Residue (NVR) Monitors and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Strossman, G. S., Lindley, P. M., Bowers, W. D.

MRS - Materials Research Society
9 Conference Proceedings Identification of atherosclerotic plaque components using cluster analysis of multispectral MR images:comparison with histology

Clarke,S., Rutt,B.K., Lucas,A., Lownie,S., Hammond,R, Mitchell,J.R.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Imaging of atherosclerotic plaques by optical coherence tomography(OCT)

Perree,J., Leeuwen,T.G.van, Pasterkamp,G., Izatt,J.A.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Laser-induced fluorescence spectroscopy (LFS): detection of unstable thrombogenic atherosclerotic plaque formation in a rabbit model: a first-look diagnostic …

Christov,A., Dai,E., Drangova,M., Liu,L., Abela,G.S., Nash,P., McFadden,G., Lucas,A.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings HIGH SENSITIVITY SURFACE ANALYSIS OF SILICON WAFERS BY TIME-OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)

Schueler, B., Hockett, R.S.

Electrochemical Society
11 Conference Proceedings Accurate Depth Profiling of Ultrathin Oxide Films by Secondary Ion Mass Spectrometry

Smith, Stephen P., Yang, Ming Hong, Chia, Victor K. F.

MRS - Materials Research Society
6 Conference Proceedings Concentration of N and P in SiC Investigated by Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Acarturk, T., Semmelroth, K., Pensl, G., Saddow, S. E., Starke, U.

Trans Tech Publications
12 Conference Proceedings High-sensitivity detection and monitoring of microcirculation using cutaneous and catheter probes for Doppler optical coherence tomography

Yang, V.X.D., Gordon, M.L., Qi, B., Yue, E.S., Tang, S., Bisland, S.K., Pekar, J., Lo, S., Marcon, N.E., Wilson, B., …

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12