Proximity-effect correction for EPL by using multiple pattern-area-density maps and pattern classification
- Author(s):
- Murai, F. ( Hitachi, Ltd. (Japan) )
- Fukuda, H. ( Hitachi, Ltd. (Japan) )
- Mori, S. ( Hitachi ULSI Systems Co., Ltd. (Japan) )
- Sato, A. ( Hitachi ULSI Systems Co., Ltd. (Japan) )
- Nakajo, K. ( Hitachi ULSI Systems Co., Ltd. (Japan) )
- Publication title:
- Photomask and Next-Generation Lithography Mask Technology X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5130
- Pub. Year:
- 2003
- Page(from):
- 888
- Page(to):
- 897
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449962 [0819449962]
- Language:
- English
- Call no.:
- P63600/5130
- Type:
- Conference Proceedings
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