Defect repair performance using the nanomachining repair technique
- Author(s):
Morikawa, Y. ( Dai Nippon Printing Co., Ltd. (Japan) ) Kokubo, H. ( Dai Nippon Printing Co., Ltd. (Japan) ) Nishiguchi, M. ( Dai Nippon Printing Co., Ltd. (Japan) ) Hayashi, N. ( Dai Nippon Printing Co., Ltd. (Japan) ) White, R. ( RAVE LLC (USA) ) Bozak, R. ( RAVE LLC (USA) ) Terrill, L. ( RAVE LLC (USA) ) - Publication title:
- Photomask and Next-Generation Lithography Mask Technology X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5130
- Pub. Year:
- 2003
- Page(from):
- 520
- Page(to):
- 527
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449962 [0819449962]
- Language:
- English
- Call no.:
- P63600/5130
- Type:
- Conference Proceedings
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