Advanced NLD mask dry etching system for 90-nm node technology
- Author(s):
Harashima, N. ( ULVAC Coating Corp. (Japan) ) Sasaki, T. ( ULVAC Coating Corp. (Japan) ) Kuwahara, K. ( ULVAC, Inc. (Japan) ) Hayashi, T. ( ULVAC, Inc. (Japan) ) Tanaka, Y. ( Semiconductor Leading Edge Technologies, Inc. (Japan) ) Yoshioka, N. ( Semiconductor Leading Edge Technologies, Inc. (Japan) ) Hara, M. ( HOYA Corp. (Japan) ) Ohkubo, Y. ( HOYA Corp. (Japan) ) - Publication title:
- Photomask and Next-Generation Lithography Mask Technology X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5130
- Pub. Year:
- 2003
- Page(from):
- 275
- Page(to):
- 280
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449962 [0819449962]
- Language:
- English
- Call no.:
- P63600/5130
- Type:
- Conference Proceedings
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