Analogue filter circuits testing using voltage and current measurements

Analogue filter circuits testing using voltage and current measurements

Author(s):: Al-Qutayri, M.A. ( Etisalat College of Engineering (United Arab Emirates) )
Publication title:: VLSI Circuits and Systems
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 5117
Pub. Year:: 2003
Page(from):: 257
Page(to):: 266
Pages:: 10
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819449771 [0819449776]
Language:: English
Call no.:: P63600/5117
Type:: Conference Proceedings

Details

TDL ID:	ZA00013106
Series ID:	PA00000029
Conf. info. (Name):	Microtechnologies for the New Millennium : VLSI Circuits and Systems
Conf. info. (Number):	2003
Conf. info. (Venue):	Maspalomas, Grand Canaria, Spain
Conf. info. (Date):	2003.05.19-2003.09.21

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