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Low-noise SOI Hall devices

Author(s):
Haddab, Y. ( SchlumbergerSema (France) )
Mosser, V. ( SchlumbergerSema (France) )
Lysowec, M. ( SchlumbergerSema (France) )
Suski, J. ( SchlumbergerSema (France) )
Demeus, L. ( Univ. Catholique de Louvain (Belgium) )
Renaux, C. ( Univ. Catholique de Louvain (Belgium) )
Adriensen, S. ( Univ. Catholique de Louvain (Belgium) )
Flandre, D. ( Univ. Catholique de Louvain (Belgium) )
3 more
Publication title:
Noise and Information in Nanoelectronics, Sensors, and Standards
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5115
Pub. Year:
2003
Page(from):
196
Page(to):
203
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449757 [081944975X]
Language:
English
Call no.:
P63600/5115
Type:
Conference Proceedings

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