Blank Cover Image

High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation

Author(s):
Rengel, R. ( Univ. de Salamanca (Spain) )
Mateos, J. ( Univ. de Salamanca (Spain) )
Pardo, D. ( Univ. de Salamanca (Spain) )
Gonzalez, T. ( Univ. de Salamanca (Spain) )
Martin, M.J. ( Univ. de Salamanca (Spain) )
Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Raskin, J.-P. ( Univ. Catholique de Louvain (Belgium) )
3 more
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. Year:
2003
Page(from):
379
Page(to):
386
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings RF Noise in a Short-Channel n-MOSFET: A Monte Carlo Study

Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M.J.

Trans Tech Publications
7 Conference Proceedings Noise modeling and performance in 0.1 5-μm fully depleted SOI MOSFET

Pailloncy, G., Ihiguez, B., Dambrine, G., Dehan, M., Raskin, J.-P., Matsuhashi, H., Delatte, P., Danneville, F.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Comparative study of the dynamic performance of bulk and FDSOI MOSFET by means of a Monte Carlo simulation

Rengel, R., Pardo, D., Martin, M.J.

Electrochemical Society
8 Conference Proceedings High frequency noise of SOI MOSFETs: performances and limitations (Invited Paper)

Danneville, F., Pailloncy, G., Siligaris, A., Iniguez, B., Dambrine, G.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Monte Carlo particle-based simulation of DG MOSFETs: influence of space-quantization effects on the high-frequency noise

Rengel, R., Gonzalez, T., Martin, M. J.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Thermal de-embedding procedure for cryogenic on-wafer high-frequency noise measurement

Delcourt, S., Dambrine, G., Bourzgui, N. E., Danneville, F., Laporte, C., Fraysse, J.-P., Maignan, M.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)

Dambrine, G., Raynaud, C., Vanmackelberg, M., Danneville, F., Pailloncy, G., Lepilliet, S., Raskin, J.P.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Characterization of SOI MOSFETs at microwave frequencies

Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G.

Electrochemical Society
5 Conference Proceedings Influence of 2D electrostatic effects on the high-frequency noise behavior of sub-100-nm scaled MOSFETs

Rengel, R., Pardo, D., Martin, M. J.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Kink-effect-related noise in InAlAs/InGaAs short-channel HEMTs

Vasallo, B.G., Mateos, J., Pardo, D., Gonzalez, T.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings High Frequency Noise Sources Extraction in Nanometique MOSFETs

Danneville, F., Pailloncy, G., Dambrine, G.

Kluwer Academic Publishers
12 Conference Proceedings Nonlocal effects and transfer fields for electronic noise in small devices (Invited Paper)

Varani, L., Vaissiere, J.-C., Shiktorov, P., Starikov, E., Gruzinskis, V., Gonzalez, T., Mateos, J., Pardo, D., …

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12