Microscopic investigation of large-signal noise in semiconductor materials and devices (Invited Paper)

Microscopic investigation of large-signal noise in semiconductor materials and devices (Invited Paper)

Author(s):

Gonzalez, T. ( Univ. de Salamanca (Spain) )

Perez, S. ( Univ. de Salamanca (Spain) )

Starikov, E. ( Semiconductor Physics Institute (Lithuania) )

Shiktorov, P. ( Semiconductor Physics Institute (Lithuania) )

Gruzinskis, V. ( Semiconductor Physics Institute (Lithuania) )

Reggiani, L. ( INFM (Italy) )

Varani, L. ( Univ. Montpellier II (France) )

Vaissiere, J.C. ( Univ. Montpellier II (France) )

3 more

Publication title:

Noise in Devices and Circuits

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5113

Pub. Year:

2003

Page(from):

252

Page(to):

266

Pages:

15

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449733 [0819449733]

Language:

English

Call no.:

P63600/5113

Type:

Conference Proceedings

Details

TDL ID:	ZA00013101
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Fluctuations and Noise : Noise in Devices and Circuits
Conf. info. (Number):	2003
Conf. info. (Venue):	Santa Fe, NM, USA
Conf. info. (Date):	2003.06.02-2003.06.04

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